WRTLT- November 27-28, 2009
The purpose of this workshop is to bring researchers and practitioners on LSI testing from all over the world together to exchange ideas and experiences on register transfer level (RTL) and high level testing.

　

　

　

　

New: Hyatt hotel reservation

New: advance program and registration details.

　

Program Highlights:

keynote speech by Jocob Abraham, UT-Austin Univ.

Invited talk I by Nicola Nicolici, McMaster Univ.

Invited talk II by Xinli Gu, Cisco Systems, Inc.

Panel: Test / Diagnosis at Multi-Core / Multi-Die Era

　

Key Dates
Submission: extended to Aug. 15th
Acceptance: Sep.11th
Camera Ready:  Oct.10th
Early Registration:  Oct.25th
Workshop:   Nov.27th-28th
　
WRTLT Topics 　

Areas of interest include but are not limited to:

       - Functional fault modeling                                                           - RTL ATPG
       - Microprocessor testing                                                              - RTL BIST
       - Relationship between RTL and gate level testing                   - Design verification
       - High level test bench generation                                               - SoC testing
       - High level approaches for testing                                                                          - RTL DFT
Sponsors